spectralon reflectance standards Search Results


90
Ocean Insight spectralon diffuse reflectance standard
Spectralon Diffuse Reflectance Standard, supplied by Ocean Insight, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
Ocean Insight 99% spectralon diffuse reflectance standard (srs-99)
99% Spectralon Diffuse Reflectance Standard (Srs 99), supplied by Ocean Insight, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
National Institute of Standards and Technology 99% reflectance spectralon standard
99% Reflectance Spectralon Standard, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
SphereOptics GmbH certified reflectance standard spectralon usrs-99-010
Certified Reflectance Standard Spectralon Usrs 99 010, supplied by SphereOptics GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
National Institute of Standards and Technology 99% spectralon white diffuse reflectance target
99% Spectralon White Diffuse Reflectance Target, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
SphereOptics GmbH 99% spectralon diffuse reflection standard
99% Spectralon Diffuse Reflection Standard, supplied by SphereOptics GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
National Institute of Standards and Technology reflectance standard spectralon® serial number 3153
Reflectance Standard Spectralon® Serial Number 3153, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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SphereOptics GmbH spectralon reflectance standard zenith lite
Spectralon Reflectance Standard Zenith Lite, supplied by SphereOptics GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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90
National Institute of Standards and Technology spectralon-based 0.99 (99%) reflectance standard
( A ) Significance of supreme-black levels for visual applications. The perceptual lightness L * is not proportional to the (luminous) <t>reflectance</t> R of an object; human eyes are much more sensitive to changes in blackness than in whiteness. ( B ) Photograph of super-black materials (lower) and reference standards (upper) with various hemispherical reflectance R ranging from 0.0003 to 1. The photo was taken in high–dynamic range mode, where the contrast was compressed to demonstrate the naked-eyesight impression within the limited dynamic range of display devices or printed media (see also fig. S1). ( C ) Three requirements for supreme blackness. ( D ) Schematic diagram showing the forms of surface reflection in terms of radiance representation. ( E ) SEM images of various super-black surfaces.
Spectralon Based 0.99 (99%) Reflectance Standard, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/spectralon-based 0.99 (99%) reflectance standard/product/National Institute of Standards and Technology
Average 90 stars, based on 1 article reviews
spectralon-based 0.99 (99%) reflectance standard - by Bioz Stars, 2026-06
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86
Edmund Optics white diffuse reflectance standard
(A, E) A plate covered with black velvet is used as a support for detached leaves. (B, F) The leaf petiole is covered with a wet paper towel. (C, G) Half of the leaf is then covered with aluminum foil, and the other half with polyester foil. (D, H) After irradiation with blue light for 1 h, materials covering the leaf halves are removed, and a <t>reflectance</t> standard is added so that the leaves are ready for imaging.
White Diffuse Reflectance Standard, supplied by Edmund Optics, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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white diffuse reflectance standard - by Bioz Stars, 2026-06
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90
BFI Optilas GmbH reflection standards spectralon
(A, E) A plate covered with black velvet is used as a support for detached leaves. (B, F) The leaf petiole is covered with a wet paper towel. (C, G) Half of the leaf is then covered with aluminum foil, and the other half with polyester foil. (D, H) After irradiation with blue light for 1 h, materials covering the leaf halves are removed, and a <t>reflectance</t> standard is added so that the leaves are ready for imaging.
Reflection Standards Spectralon, supplied by BFI Optilas GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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86
Labsphere Inc spectralon reflectance standards
(A, E) A plate covered with black velvet is used as a support for detached leaves. (B, F) The leaf petiole is covered with a wet paper towel. (C, G) Half of the leaf is then covered with aluminum foil, and the other half with polyester foil. (D, H) After irradiation with blue light for 1 h, materials covering the leaf halves are removed, and a <t>reflectance</t> standard is added so that the leaves are ready for imaging.
Spectralon Reflectance Standards, supplied by Labsphere Inc, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 86 stars, based on 1 article reviews
spectralon reflectance standards - by Bioz Stars, 2026-06
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Image Search Results


( A ) Significance of supreme-black levels for visual applications. The perceptual lightness L * is not proportional to the (luminous) reflectance R of an object; human eyes are much more sensitive to changes in blackness than in whiteness. ( B ) Photograph of super-black materials (lower) and reference standards (upper) with various hemispherical reflectance R ranging from 0.0003 to 1. The photo was taken in high–dynamic range mode, where the contrast was compressed to demonstrate the naked-eyesight impression within the limited dynamic range of display devices or printed media (see also fig. S1). ( C ) Three requirements for supreme blackness. ( D ) Schematic diagram showing the forms of surface reflection in terms of radiance representation. ( E ) SEM images of various super-black surfaces.

Journal: Science Advances

Article Title: Supreme-black levels enabled by touchproof microcavity surface texture on anti-backscatter matrix

doi: 10.1126/sciadv.ade4853

Figure Lengend Snippet: ( A ) Significance of supreme-black levels for visual applications. The perceptual lightness L * is not proportional to the (luminous) reflectance R of an object; human eyes are much more sensitive to changes in blackness than in whiteness. ( B ) Photograph of super-black materials (lower) and reference standards (upper) with various hemispherical reflectance R ranging from 0.0003 to 1. The photo was taken in high–dynamic range mode, where the contrast was compressed to demonstrate the naked-eyesight impression within the limited dynamic range of display devices or printed media (see also fig. S1). ( C ) Three requirements for supreme blackness. ( D ) Schematic diagram showing the forms of surface reflection in terms of radiance representation. ( E ) SEM images of various super-black surfaces.

Article Snippet: A Spectralon-based 0.99 (99%) reflectance standard was used as a reference, which was calibrated traceably to the U.S. National Institute of Standards and Technology (NIST).

Techniques:

( A ) Fabrication procedure of microcavity-structured supreme-black finish. A microcavity master mold is fabricated by the ion track etching method: A single high-quality conical etch pit is formed per ion track on a CR-39 plastic substrate. Then, the master mold was replicated into a PDMS replica mold, which was then stamped onto a black prepolymer. ( B ) AR principle of microcavity and requirements for achieving ultralow reflectance. It also depicts how light is backscattered by pigment particles, if any. ( C ) SEM image of microcavities on the surface of CNSL-based supreme black. ( D ) UV/Vis/NIR spectral hemispherical reflectance of a CNSL-based supreme-black sheet, compared with the previously reported blackbody sheets (PDMS and CB based) . ( E ) Molecular structure of CNSL. ( F ) Extremely low light scattering from a flat CNSL-based black film under intense illumination or laser marker, compared with a CB-based one. ( G and H ) OD defined as log(1/ T ) (G), where T = transmittance of thin CNSL-based brown and black coating (inset), and results of SEM-EDS analysis (H); CNSL black contains iron to form the phenolic complex. ( I ) Simulated Mie scattering efficiency for CB particles with various radii dispersed in PDMS. See also fig. S2 and Materials and Methods for details of the simulation conditions.

Journal: Science Advances

Article Title: Supreme-black levels enabled by touchproof microcavity surface texture on anti-backscatter matrix

doi: 10.1126/sciadv.ade4853

Figure Lengend Snippet: ( A ) Fabrication procedure of microcavity-structured supreme-black finish. A microcavity master mold is fabricated by the ion track etching method: A single high-quality conical etch pit is formed per ion track on a CR-39 plastic substrate. Then, the master mold was replicated into a PDMS replica mold, which was then stamped onto a black prepolymer. ( B ) AR principle of microcavity and requirements for achieving ultralow reflectance. It also depicts how light is backscattered by pigment particles, if any. ( C ) SEM image of microcavities on the surface of CNSL-based supreme black. ( D ) UV/Vis/NIR spectral hemispherical reflectance of a CNSL-based supreme-black sheet, compared with the previously reported blackbody sheets (PDMS and CB based) . ( E ) Molecular structure of CNSL. ( F ) Extremely low light scattering from a flat CNSL-based black film under intense illumination or laser marker, compared with a CB-based one. ( G and H ) OD defined as log(1/ T ) (G), where T = transmittance of thin CNSL-based brown and black coating (inset), and results of SEM-EDS analysis (H); CNSL black contains iron to form the phenolic complex. ( I ) Simulated Mie scattering efficiency for CB particles with various radii dispersed in PDMS. See also fig. S2 and Materials and Methods for details of the simulation conditions.

Article Snippet: A Spectralon-based 0.99 (99%) reflectance standard was used as a reference, which was calibrated traceably to the U.S. National Institute of Standards and Technology (NIST).

Techniques: Marker

( A ) Schematic illustration of the anti-backscatter multilayer structures. Various existing super-black materials can be chosen as an underlayer. ( B to D ) Spectral hemispherical reflectance of microcavity supreme-black finishes fabricated with various combinations of multilayer structures (B), schematic illustration of reflectance measurements under SCI and SCE geometries (C), and average visible hemispherical (SCI) reflectance R SCI for the multilayer microcavity supreme-black finishes and average visible diffuse (SCE) reflectance R SCE for the corresponding flat samples (D). The same line color in the graph (B) and row color in the table (D) correspond to the same sample. ( E ) Comparison between the measured diffuse (SCE) reflectance R SCE and the normalized theoretical reflectance for CB and aluminum oxide black in terms of the dependence on the refractive index of the surrounding medium (see also fig. S4 and Materials and Methods for details).

Journal: Science Advances

Article Title: Supreme-black levels enabled by touchproof microcavity surface texture on anti-backscatter matrix

doi: 10.1126/sciadv.ade4853

Figure Lengend Snippet: ( A ) Schematic illustration of the anti-backscatter multilayer structures. Various existing super-black materials can be chosen as an underlayer. ( B to D ) Spectral hemispherical reflectance of microcavity supreme-black finishes fabricated with various combinations of multilayer structures (B), schematic illustration of reflectance measurements under SCI and SCE geometries (C), and average visible hemispherical (SCI) reflectance R SCI for the multilayer microcavity supreme-black finishes and average visible diffuse (SCE) reflectance R SCE for the corresponding flat samples (D). The same line color in the graph (B) and row color in the table (D) correspond to the same sample. ( E ) Comparison between the measured diffuse (SCE) reflectance R SCE and the normalized theoretical reflectance for CB and aluminum oxide black in terms of the dependence on the refractive index of the surrounding medium (see also fig. S4 and Materials and Methods for details).

Article Snippet: A Spectralon-based 0.99 (99%) reflectance standard was used as a reference, which was calibrated traceably to the U.S. National Institute of Standards and Technology (NIST).

Techniques: Comparison, Refractive Index

( A ) The contrast ratio of diffusive white against our supreme black is 7.3 × 10 3 in the best case. ( B ) Flexible CNSL-based supreme-black sheet. ( C ) Durability test of CNSL-based supreme-black sheet. No change was observed in the ultralow reflectance after air blowing, silicone roller duster application, or finger touch. ( D ) SEM image of the CNSL-based supreme-black sheet surface after finger touch. No contamination was observed. ( E ) Incident angle dependence of hemispherical reflectance of the CNSL-based supreme-black sheet. In the rightmost graph, the angle of incidence is plotted on the horizontal axis, and the visible average hemispherical reflectance is plotted on the vertical axis. ( F ) Directional reflection properties of the CNSL-based supreme-black sheet at a large angle incidence. A strong reflection was observed at a certain large incident angle when illuminated from near the viewing direction [(i), see also rightmost photo], whereas there is no strong reflection in the normal (ii) and specular direction (iii).

Journal: Science Advances

Article Title: Supreme-black levels enabled by touchproof microcavity surface texture on anti-backscatter matrix

doi: 10.1126/sciadv.ade4853

Figure Lengend Snippet: ( A ) The contrast ratio of diffusive white against our supreme black is 7.3 × 10 3 in the best case. ( B ) Flexible CNSL-based supreme-black sheet. ( C ) Durability test of CNSL-based supreme-black sheet. No change was observed in the ultralow reflectance after air blowing, silicone roller duster application, or finger touch. ( D ) SEM image of the CNSL-based supreme-black sheet surface after finger touch. No contamination was observed. ( E ) Incident angle dependence of hemispherical reflectance of the CNSL-based supreme-black sheet. In the rightmost graph, the angle of incidence is plotted on the horizontal axis, and the visible average hemispherical reflectance is plotted on the vertical axis. ( F ) Directional reflection properties of the CNSL-based supreme-black sheet at a large angle incidence. A strong reflection was observed at a certain large incident angle when illuminated from near the viewing direction [(i), see also rightmost photo], whereas there is no strong reflection in the normal (ii) and specular direction (iii).

Article Snippet: A Spectralon-based 0.99 (99%) reflectance standard was used as a reference, which was calibrated traceably to the U.S. National Institute of Standards and Technology (NIST).

Techniques:

(A, E) A plate covered with black velvet is used as a support for detached leaves. (B, F) The leaf petiole is covered with a wet paper towel. (C, G) Half of the leaf is then covered with aluminum foil, and the other half with polyester foil. (D, H) After irradiation with blue light for 1 h, materials covering the leaf halves are removed, and a reflectance standard is added so that the leaves are ready for imaging.

Journal: Bio-protocol

Article Title: Chloroplast Movement Imaging Under Different Light Regimes With a Hyperspectral Camera

doi: 10.21769/BioProtoc.5541

Figure Lengend Snippet: (A, E) A plate covered with black velvet is used as a support for detached leaves. (B, F) The leaf petiole is covered with a wet paper towel. (C, G) Half of the leaf is then covered with aluminum foil, and the other half with polyester foil. (D, H) After irradiation with blue light for 1 h, materials covering the leaf halves are removed, and a reflectance standard is added so that the leaves are ready for imaging.

Article Snippet: White diffuse reflectance standard (Spectralon or BaSO 4 -based reflectance standard, e.g., Edmund Optics, catalog number: #54-302) 3.

Techniques: Irradiation, Imaging

Leaves detached from dark-adapted plants were irradiated with either 1.6 or 120 µmol·m -2 ·s -1 of blue light for 1 h to induce chloroplast accumulation and avoidance responses, respectively. Half of the leaf remained in the dark-adapted state, as it was covered with aluminum foil during irradiation. (A, B) Mean difference in reflectance spectra between irradiated and darkened leaf halves calculated from hyperspectral images of 23 low- and 31 high-light-irradiated leaves. Note that the y-axis range in panels A and B is different. The standard deviation is indicated in light blue, and the standard error in darker blue. (C, D) Reflectance images of N. benthamiana leaves, calculated as an average of the hyperspectral images in the visible (400–700 nm) range. Spectra in A and B redrawn from Hermanowicz, P. and Łabuz, J. 2025 [20].

Journal: Bio-protocol

Article Title: Chloroplast Movement Imaging Under Different Light Regimes With a Hyperspectral Camera

doi: 10.21769/BioProtoc.5541

Figure Lengend Snippet: Leaves detached from dark-adapted plants were irradiated with either 1.6 or 120 µmol·m -2 ·s -1 of blue light for 1 h to induce chloroplast accumulation and avoidance responses, respectively. Half of the leaf remained in the dark-adapted state, as it was covered with aluminum foil during irradiation. (A, B) Mean difference in reflectance spectra between irradiated and darkened leaf halves calculated from hyperspectral images of 23 low- and 31 high-light-irradiated leaves. Note that the y-axis range in panels A and B is different. The standard deviation is indicated in light blue, and the standard error in darker blue. (C, D) Reflectance images of N. benthamiana leaves, calculated as an average of the hyperspectral images in the visible (400–700 nm) range. Spectra in A and B redrawn from Hermanowicz, P. and Łabuz, J. 2025 [20].

Article Snippet: White diffuse reflectance standard (Spectralon or BaSO 4 -based reflectance standard, e.g., Edmund Optics, catalog number: #54-302) 3.

Techniques: Irradiation, Standard Deviation